The FISCHERSCOPE® X-RAY XDV®-SDD features a silicon drift detector with a large sensitive area and good energy resolution. When combined with large apertures, very high count rates can be realized, producing excellent repeatability precision and very low detection limits. The XDV®-SDD is particularly well suited for measuring the thinnest of coatings for trace analysis. The improved sensitivity for X-radiation with low energy also expands the range of measurable elements down to lower atomic numbers, enabling, for example, the reliable measurement of phosphorous or aluminum in air.
In order to create ideal excitation conditions for every measurement, the XDV®-SDD features exchangeable apertures and primary filters.
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