FISCHERSCOPE® X-RAY XDV-µ® Measuring Systems

The FISCHERSCOPE® X-RAY XDV-µ® measurement systems are equipped with a poly-capillary X-ray optics for focusing the X-radiation. This enables both the resolution of very small measurement spots and high excitation intensity. The instruments’ large-area silicon drift detectors make them particularly effective for measuring very thin coatings, as well as for trace analysis on small structures or components.

In order to create optimal excitation conditions for every measurement, the XDV-µ® systems are supplied with four exchangeable primary filters.

With their large and easily accessible measurement chambers, the XDV-µ® instruments are well-suited for measurements on flat, plane objects. For large, flat samples such as PC Boards, the housing has openings on the side (C-slot).