FISCHERSCOPE® X-RAY XDAL® Measuring Instruments

In its design, the FISCHERSCOPE® X-RAY XDAL® measurement system corresponds to the XDLM. The difference is in the type of detector. With the XDAL®, a Peltier-cooled silicon PIN detector is used with an energy resolution that is significantly better than that of the proportional counter tube used in the XDLM®. This instrument is, therefore, suited for general materials analysis, trace analysis and for measurement of thin coatings.